THESIS
2020
xii, 102 pages : illustrations (some color) ; 30 cm
Abstract
Nanostructured interfaces have served as a crucial aspect to tailor both chemical and
physical properties of today’s newly emerging materials, whose effects become increasingly
important when the system dimension scales down. Therefore, a precise knowledge on the
structural variation as well as the chemical inhomogeneity of nanostructured interfaces, ideally
at atomic scale, is indispensable for the rational design of nanomaterials’ functionality. In this
thesis, atomic-resolution transmission electron microscopy (TEM) study was conducted to
investigate the critical roles played by two types of functional interfaces in nanomaterials,
including the metal-semiconductor junction in 2D-material electronic devices and the metal-support
heterostructure in atomically dispersed catalyst...[
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Nanostructured interfaces have served as a crucial aspect to tailor both chemical and
physical properties of today’s newly emerging materials, whose effects become increasingly
important when the system dimension scales down. Therefore, a precise knowledge on the
structural variation as well as the chemical inhomogeneity of nanostructured interfaces, ideally
at atomic scale, is indispensable for the rational design of nanomaterials’ functionality. In this
thesis, atomic-resolution transmission electron microscopy (TEM) study was conducted to
investigate the critical roles played by two types of functional interfaces in nanomaterials,
including the metal-semiconductor junction in 2D-material electronic devices and the metal-support
heterostructure in atomically dispersed catalysts.
The dissertation starts with a brief history through the development of electron microscopy.
The theoretical principles and instrumentation of electron-matter interactions and aberration-corrected
electron optics utilized by the modern TEM will be discussed, followed by the
introduction to two types of nanostructured interfaces as study subjects. The focus will then be
placed on how the microscopic investigation of interfacial structure and composition can be
correlated to the materials’ functionality.
As for the experimental techniques, different material-property measurements and TEM
sample-preparation methods will be described in detail. Both the aberration-corrected scanning TEM and other complementary characterization tools, such as in-situ TEM and synchrotron X-ray
absorption spectroscopy, are covered in this chapter.
By applying the atomic-scale TEM investigation to two distinct functional interfaces, results
were obtained and analyzed in the following chapters:
Chapter 3 aims to fix the problem of bridging metal leads to two-dimensional transition
metal dichalcogenide semiconductors by the oxygen-plasma-induced local structure distortion
in the metal-semiconductor junction. Low-voltage atomic-resolution cross-section imaging of
the contact region in practical 2H MoS
2 and WSe
2 field-effect devices reveals the interfacial
distorted nanophase as the efficient carrier-injection path, which greatly enhances contact
properties by achieving the record-low contact resistance of 90 Ωμm, towards the quantum
limit, and the record-high field-effect mobility of 358,000 cm
2V
-1s
-1, comparable to those of
high-quality graphene devices. Such barrier-free electrical contact also enables the detection of
prominent quantum transport at the low/fractional filling factors showing signals of intricate e-e
interaction effects.
Chapter 4 concentrates on the effects of metal-support interactions on the metal dispersion
behaviors of nanocarbon-supported catalysts. A wide range of single-atom catalysts have been
synthesized due to the defect-engineered strong metal-support interactions and demonstrated to
possess unparallel thermal stability on top of boosted catalytic performance. The unique metal-defect
coordination was further extended to fabricate atomically dispersed bimetallic catalysts
with composition-modulated morphologies and catalytic characteristics.
In summary, atomic-scale TEM can be widely applicable to other fundamental or industrial
problems pertinent to the nanostructured interface, even more regarding the materials science.
The unsolved points and prospects for future works will also be discussed in Chapter 5 at the
end of this thesis.
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