THESIS
2014
xvi, 111 pages : illustrations ; 30 cm
Abstract
As the most commonly used characterization method, the X-Ray Diffraction (XRD) has
been widely used for detcting zeolites and zeolite-like material. Zeolites have been widely
studied for many applications in various field such as catalysis, purification, and separation.
Unfortunately, for zeolite characterization, XRD has a limitation on sensitivity. By using XRD,
the zeolite structures are only detectable when the zeolite content is more than 3% of the
mixture.
In order to overcome this limitation, the Time-of-Flight Secondary Ion Mass
Spectroscopy (ToF-SIMS) is examined in this study. With the assistance of Principal
Component Analysis (PCA) for zeolite detection, the sensitivity limit of this technique is
compared with ToF-SIMS. Different zeolite species ZSM-5, Sil-1, NaA, a...[
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As the most commonly used characterization method, the X-Ray Diffraction (XRD) has
been widely used for detcting zeolites and zeolite-like material. Zeolites have been widely
studied for many applications in various field such as catalysis, purification, and separation.
Unfortunately, for zeolite characterization, XRD has a limitation on sensitivity. By using XRD,
the zeolite structures are only detectable when the zeolite content is more than 3% of the
mixture.
In order to overcome this limitation, the Time-of-Flight Secondary Ion Mass
Spectroscopy (ToF-SIMS) is examined in this study. With the assistance of Principal
Component Analysis (PCA) for zeolite detection, the sensitivity limit of this technique is
compared with ToF-SIMS. Different zeolite species ZSM-5, Sil-1, NaA, and NaX (MFI-,
FAU- and LTA-type) are tested in this research as mixtures with crystallized silica. Results
indicates that and the sensitivity limit of ToF-SIMS is higher than that of XRD.
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