THESIS
2011
xi, 80 p. : ill. ; 30 cm
Abstract
Wide Bandgap GaN-based devices are capable of high voltage and high current operation,
and feature high switching frequency that favors down-scaling of the indispensible passive
components in switch-mode power converters. In addition, GaN maintains excellent
semiconductor stability at high temperature and can operate at temperature much higher than
allowed by the mainstream Si devices. This work focuses on utilizing and integrating the
AlGaN/GaN HEMTs and rectifiers for analog and digital integrated circuits using a recently
developed smart power IC platform. The demonstrated analog circuits include bootstrapped
comparator, current mirror and voltage level shifter, and the digital functional blocks include
NOR/NAND gates and Schmitt trigger.
Detailed characterizations of the ke...[
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Wide Bandgap GaN-based devices are capable of high voltage and high current operation,
and feature high switching frequency that favors down-scaling of the indispensible passive
components in switch-mode power converters. In addition, GaN maintains excellent
semiconductor stability at high temperature and can operate at temperature much higher than
allowed by the mainstream Si devices. This work focuses on utilizing and integrating the
AlGaN/GaN HEMTs and rectifiers for analog and digital integrated circuits using a recently
developed smart power IC platform. The demonstrated analog circuits include bootstrapped
comparator, current mirror and voltage level shifter, and the digital functional blocks include
NOR/NAND gates and Schmitt trigger.
Detailed characterizations of the key devices including Enhancement-mode (E-mode)
HEMT, Depletion-mode (D-mode) HEMT, Schottky Barrier Diode (SBD) and the Later Field
Effect Rectifier (L-FER) are carried out to provide basic design library in the context of GaN
smart power IC development. Several design rules are discussed for better device
performance and yield.
A high-performance bootstrapped comparator operating with a single-polarity power
supply is demonstrated. The comparator features monolithically integrated E/D-mode
AlGaN/GaN HEMTs. The tail current source uses E-mode HEMT, enabling single-polarity
power supply. The input stage could be either E-mode or D-mode HEMTs to cover a wide
input voltage range, while the bootstrapped loads are implemented with D-mode HEMTs. The
hysteresis configuration is shown to be applicable when provided with a buffer stage. To
provide mirroring function for static circuits with proper biasing and operation range, the GaN
current mirror composed of D-mode HEMTs and L-FERs is also designed and demonstrated.
GaN voltage level shifter is shown to deliver desirable voltage drop both for analog signal
matching between functional cells, and for noise margin extension and output to input
matching in digital circuits.
Similar to the GaN Direct Coupled FET Logic (DCFL) inverter, the DCFL NOR gate and
NAND gate are demonstrated with integrated E/D-mode HEMTs. It is shown that the
input/output voltage level matching can be achieved with voltage level shifter, in a
DCFL/BFL (buffered FET logic) configuration. Furthermore, a GaN Schmitt trigger circuit
was demonstrated for the first time.
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