Graphene, a single-layer of carbon atoms, has been widely used in various applications due
to its unique physical properties and two-dimensional structure. Graphite, which is made of
stacked carbon layers, exhibits good electrical and thermal conductivities. Highly oriented
pyrolytic graphite (HOPG) is a highly ordered form of synthetic graphite and has a smooth and
almost defect-free surface. In this thesis, we used X-ray photoelectron spectroscopy (XPS) and
time-of-flight secondary ion mass spectrometry (ToF-SIMS) to characterize the surface
chemical compositions of graphene and graphite annealed at different temperatures and after
different surface modifications.
First, the surface of graphene after washing with acetone and annealing at different
temperatures was monitored by XPS and ToF-SIMS. The concentrations of residual
poly(methyl methacrylate) (PMMA) and hydrocarbon contaminants decreased as the annealing
temperature increased. A clean graphene surface can be obtained by annealing at 500 °C in an
ultra-high vacuum chamber without creating any additional defects.
In the XPS C1s spectrum of graphene, besides an asymmetric sp
2 carbon peak and a π-π*
shake-up peak appeared, an additional sp
3 carbon peak representing sp
3 defects was also
present. In the ToF-SIMS positive ion spectrum of clean graphene, a series of C
xH
2+• (where x=1, 2, 3…) ions originated from the defects of graphene was found. To confirm this finding,
defects were created by ion bombardment of a HOPG surface. A detailed examination of the
positive ion spectra of ion-bombarded HOPG surfaces reveals the presence of the C
xH
2+• ions,
confirming that these C
xH
2+• ions, which came from the defects created on the sputtered HOPG
surfaces, are similar to the defects present on a graphene surface. A sp
3 carbon peak
representing sp
3 defects appeared in the XPS spectra of sputtered HOPG samples, confirming
that the surface of the sputtered HOPG is similar to that of graphene.
The sputtered HOPG was then annealed at different temperatures under Ar flow. The XPS
and ToF-SIMS spectra of the sputtered HOPG after annealing at 800 °C were observed to be
similar to the spectra of the fresh HOPG. The sp
3 carbon peak had disappeared from the C1s
spectrum and the normalized intensities of the C
xH
- and C
xH
2+• ions had decreased. These
results indicate that defects created by sputtering on the surface of HOPG can be repaired by
high temperature annealing.
Second, hydrogenated graphite powder was obtained through Birch reduction of graphite
powder and characterized by XPS and ToF-SIMS at 500 °C. The formation of sp
3 carbons at
the edges of the surface of the hydrogenated graphite powder contributes to further analyzing
of sp
3 carbons. The formed sp
3 carbons on the hydrogenated graphite powder surface exhibited
a sp
3 carbon peak in the XPS C1s spectrum. Two sets of peaks, the C
x- and C
xH
- ion series,
were identified in the ToF-SIMS spectra of both the graphite and hydrogenated graphite
powders. The difference between these two spectra represented an increase in the normalized
intensities of the H
- and C
xH
- ions in the spectrum of the hydrogenated graphite powder,
indicating the formation of more sp
3 carbons on the surface.
Third, the surface of graphite powder was further modified and used for environmental
applications. Graphite oxide powder was obtained using the modified Hummers’ method and
characterized using XPS and ToF-SIMS. The XPS results indicate that the epoxy groups are
the main functional groups on the graphite oxide powder surface. The graphite oxide powder
was then reacted with sulfur dioxide (SO
2) and ammonia (NH
3) gases, respectively, at 25 °C.
The XPS and ToF-SIMS analyses of the surface of the reacted graphite oxide powder showed
that bisulfate and amine groups were formed on the surface of the graphite oxide powder after
the reactions between the graphite oxide powder and SO
2 and NH
3 gases.
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